安立
ME7838 Series 宽带矢量网络分析仪
VectorStar 宽带矢量网络分析仪,2 端口单次连续扫描覆盖 70 kHz 至 110/125/145/220 GHz,配毫米波模块可扩展 至 1.1 THz,24 小时校准与测量稳定性达 0.1 dB。
产品简介
VectorStar ME7838系列宽带系统提供了高性能紧凑的毫米波模块,具有业界最佳的校准稳定性。其他宽带系统仍然使用在关键频段上原始方向性性能较差的技术,而ME7838系列是在所有频段都具有较好方向性的唯一的宽带系统。其结果是更好的校准稳定性和更好的测量稳定性,意味着需要二次校准的间隔时间较长,可以进行精确的测量和提高生产效率。
新的ME7838D同外加的安立MA25300A毫米波模块一齐将高性能宽带测量系统性能提升到一个新的水平。该MA25300A模块增加了一个波导频段,并结合了安立开发的0.8毫米同轴连接器,提供了世界上第一台单次扫描操作超出了W波段限制的宽带矢量网络分析仪。
所有的VectorStar ME7838宽带系统都包含一个RF VNA架构,使用电桥取代了耦合器,从而扩展了频率下限到RF频段(可操作到40KHz),用于近直流分析,具有优异的动态范围。
AWR Connected™ to Anritsu VectorStar
Anritsu's VectorStar Vector Network Analyzer (VNA) uniquely combines design and measurement by including AWR's Microwave Office® design software as a standard feature within the instrument, as a separate application on your desktop.
You now have access to all of the design tools essential for high-frequency IC, PCB, and module design at your fingertips, right on your VNA, including:
Linear circuit simulators
Electromagnetic (EM) analysis tools
Integrated schematic and layout
The integration of high-frequency design tools within high-performance VNAs is the way of the future - but it's available today, only from Anritsu and AWR.
核心特点
• The VectorStar ME7838 Series broadband VNA offers the widest available single frequency sweep from 70 kHz 至 110, (ME7838AX 至 125), (ME7838EX 至 125), to 145 GHz, and to 220 GHz with mmWave bands to 1.1 THz.
• The ME7838AX or ME7838EX version can easily be upgraded to 145 GHz and to 220 GHz
• 所有型号都可以配置相应的毫米波模块,频率可达1.1 THz
• 业界最好的校准和测量稳定性: 0.1 dB vs 0.6 dB 整个24 小时
• All versions support the 3744x-Rx receiver for noise figure measurements, including the ability to characterize differential noise figure, to 125 GHz
• 紧凑,轻巧型毫米波模块 (0.6 磅 vs 7+磅 和1/50的体积) 为小型探针台提供了较低的安装成本
功能与结构
Published Content
The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.
Extraordinary Permittivity Characterization of 4H SiC at Millimeter-wave Frequencies
Lei Li, Mohammad Javad Asadi, School of Electrical and Computer Engineering, Cornell University Steve Reyes, Anritsu Company Patrick Fay, Department of Electrical Engineering, The University of Notre Dame James C. M. Hwang, School of Electrical and Computer Engineering, Cornell University And Department of Materials Science and Engineering, Cornell University. 22 June 2023
Calibration, Repeatability and Related Characteristics of On-wafer, Broadband 70kHz-220 GHz Single-Sweep Measurements
Andrej Rumiantsev, MPI Corporation Jon Martens, Steve Reyes, Anritsu Company. 02 Nov 2020
Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials. 16 Apr 2020
A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications. 22 Aug 2019
3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; nature.com Scientific Reports. 04 Dec 2019
Third Party Solutions
Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.
Material Measurements
Compass Technology
Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz 至 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more.
Anritsu and Compass Technology Group Material Measurements Solutions
Compass Technology Group VectorStar Integration [video]
Keycom Technologies
Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more.
Anritsu and Keycom Material Measurement Solution
SWISSto12
Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more.
Anritsu and SWISSto12 Material Measurement Solution
型号与选件
• MS4642B-049:70 kHz 至 20 GHz Spectrum Analyzer option
• MS4644B-049:70 kHz 至 40 GHz Spectrum Analyzer option
• MS4647B-049:70 kHz 至 70 GHz Spectrum Analyzer option
• MS4640B-049:SPA options for all broadband and banded solutions
• Model:Description
• ME7838AX:70 kHz 至 125 GHz, (with guaranteed specifications) broadband VNA , 1mm coax output
• ME7838EX:70 kHz 至 110 GHz, Broadband VNA, 1 mm coax output
• ME7838D:70 kHz 至 145 GHz, Broadband VNA, 0.8 mm coax output
• ME7838G:70 kHz 至 220 GHz, Broadband VNA, 0.6 mm/G output
资源下载
• 官方资料:Vector Network Analysis Product Portfolio(产品手册)、Anritsu's RF and Microwave Test and Measurement Solutions Product Brochure(产品手册)、VectorStar E and W Band Millimeter-Wave VNA System Quick Fact Sheet(产品手册)、VectorStar 2 and 4-port Millimeter-Wave Quick Fact Sheet(产品手册)、Anritsu and Polar Instrument Solution for Delta-L 4.0 Measurement Based on Atlas SI Software with Anritsu 4-Port Benchtop VNAs Solution Flyer(产品手册)、VNA Fundamentals Poster(产品手册)
注:以上内容与指标取自安立官网该产品详情页。
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