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AQ7420 High-Resolution Reflectometer属于光损耗测试仪类别。The AQ7420 precisely identifies both the location and magnitude of reflections within optical connectors and modules, revealing microcracks or misalignments tha
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AQ7420 插回损测试仪|横河测试测量 (在产)
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横河测试测量 YOKOGAWA
AQ7420 High-Resolution Reflectometer
The AQ7420 precisely identifies both the location and magnitude of reflections within optical connectors and modules, revealing microcracks or misalignments that standard loss measurements often miss.
产品简介
Compared to OFDR-based Optical Backscatter Reflectometer (OBR) or OCWR methods, the AQ7420 delivers sharper, spurious-free waveforms, making it ideally suited for high-precision inspection. These capabilities are particularly valuable for reliability testing of components subjected to prolonged high-temperature operation, where hidden defects can cause premature failure. When paired with the optional sensor head unit, it can also measure insertion loss simultaneously, providing a versatile solution for both R&D and production environments.
官方定位：The AQ7420 precisely identifies both the location and magnitude of reflections within optical connectors and modules, re…
核心参数
• Spatial resolution：40 μm
• Spurious noise：−100 dB avoids false (ghost) effects
产品特点
Spurious Noise Reduction
• Measurement distance: 100 mm (approx. 4 inches)
• Spatial resolution: 40 μm
• Spurious noise: −100 dB avoids false (ghost) effects
With some conventional reflectometers, spurious noises may falsely appear in areas where there is no actual reflection. Waveform analysis often requires that users have specialized knowledge of this sort of phenomena. The AQ7420 greatly reduces spurious noises and simplifies analysis.
Simultaneous Measurement of Multiple Reflection and Insertion Loss
Traditionally, reflectometers have been inadequate for inspection of reflection attenuation due to poor measurement accuracy of the vertical axis (back reflection). The AQ7420 enables measurement with an uncertainty of ±3dB, and using the optical sensor head, connector connection loss can be measured simultaneously with an uncertainty of ±0.02 dB.
Multi-Fiber Measurement
By combining with the optional multi-switch unit, multi-fiber measurement becomes available. Channel switching time: 1 sec Channel switching repeatability: ±0.02 dB Insertion loss: ≤ 2.6 dB
Microcrack Analysis for Optical Connectors
The AQ7420 simultaneously measures breaks, cracks, losses, and reflections of optical connectors.
Measurement example of microcracks in optical connectors (high sensitivity range)
Microcrack Analysis for Optical Connectors | AQ7420 High-Resolution Reflectometer | Yokogawa Test&Measurement
Microcrack Analysis for Optical Connectors | AQ7420 High-Resolution Reflectometer | Yokogawa Test&Measurement
典型应用
RL and IL Measurement in One Step
By combining the AQ7420/AQ7421 with the AQ740023 Sensor Head, users can automatically measure both return loss and insertion loss at two wavelengths simultaneously with a single system. With its spurious-free and high-sensitivity performance, the system clearly distinguishes reliable products (absence of reflection peaks) from defective ones (reflection peaks present). The control software also issues inspection reports to streamline quality management.
RL and IL Measurement in One Step
Dual-Wavelength RL and IL Measurement for Multi-Fiber Devices
When paired with the AQ740027, the AQ7420/AQ7421 enables automatic inspection of multiple fibers and devices such as splitters. It can measure return loss and insertion loss simultaneously across multiple ports. This eliminates the need for manual reconnections or switching, allowing multiple ports to be tested with a single button press for maximum efficiency.
Dual-Wavelength RL and IL Measurement for Multi-Fiber Devices
Distance
Component Position and Reflection Analysis in Optical Devices
With high spatial resolution, spurious-free operation, and sharp waveforms, the AQ7420 precisely identifies component positions inside optical devices and measures the reflected light generated at their edges.
Optical device
Component Position and Reflection Analysis in Optical Devices
资源下载
详细指标请见 AQ7420 High-Resolution Reflectometer 详细指标页。
横河测试测量 · onetest 仪器资源库
横河测试测量 YOKOGAWA
AQ7420 High-Resolution Reflectometer 详细指标
AQ7420 High-Resolution Reflectometer（光损耗测试仪）关键指标汇总。数据整理自厂商官方产品页与手册资料。
产品简介
Compared to OFDR-based Optical Backscatter Reflectometer (OBR) or OCWR methods, the AQ7420 delivers sharper, spurious-free waveforms, making it ideally suited for high-precision inspection. These capabilities are particularly valuable for reliability testing of components subjected to prolonged high-temperature operation, where hidden defects can cause premature failure. When paired with the optional sensor head unit, it can also measure insertion loss simultaneously, providing a versatile solution for both R&D and production environments.
详细指标
Spurious Noise Reduction
• Measurement distance: 100 mm (approx. 4 inches)
• Spatial resolution: 40 μm
• Spurious noise: −100 dB avoids false (ghost) effects
• With some conventional reflectometers, spurious noises may falsely appear in areas where there is no actual reflection. Waveform analysis often requires that users have specialized knowledge of this sort of phenomena. The AQ7420 greatly reduces spurious noises and simplifies analysis.
Simultaneous Measurement of Multiple Reflection and Insertion Loss
• Traditionally, reflectometers have been inadequate for inspection of reflection attenuation due to poor measurement accuracy of the vertical axis (back reflection). The AQ7420 enables measurement with an uncertainty of ±3dB, and using the optical sensor head, connector connection loss can be measured simultaneously with an uncertainty of ±0.02 dB.
Multi-Fiber Measurement
• By combining with the optional multi-switch unit, multi-fiber measurement becomes available. Channel switching time: 1 sec Channel switching repeatability: ±0.02 dB Insertion loss: ≤ 2.6 dB
Microcrack Analysis for Optical Connectors
• The AQ7420 simultaneously measures breaks, cracks, losses, and reflections of optical connectors.
• Measurement example of microcracks in optical connectors (high sensitivity range)
手册与资料
说明
以上指标摘自厂商官方产品页与公开手册，若与随机文件不一致，以随箱文件为准。
横河测试测量 · onetest 仪器资源库
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