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AQ23811A Source Measure Unit (±6 V / ±600 mA)属于源表类别。The AQ23811A is a two-channel source measure unit module for the AQ2300 Series Test Platform. It combines voltage and current generation with voltage and curren
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AQ23811A Source Measure Unit (±6 V / ±600 mA)
The AQ23811A is a two-channel source measure unit module for the AQ2300 Series Test Platform. It combines voltage and current generation with voltage and current measurement, allowing electrical characteristics to be evaluated using a single compact module.
产品简介
The AQ23811A is designed for the evaluation and inspection of optical semiconductor devices such as laser diodes, photodiodes, LEDs, and optical modulators, as well as electronic semiconductor devices such as transistors and FETs. A nine-slot AQ2300 frame can accommodate up to 18 SMU channels.
官方定位：The AQ23811A is a two-channel source measure unit module for the AQ2300 Series Test Platform. It combines voltage and cu…
核心参数
• Source & Measure：±6 V / ±600 mA
• Sink & Measure：±6 V / ±200 mA / ±2 V / ±600 mA
• Minimum Cycle：100 μs
产品特点
Key Specifications
• Source & Measure: ±6 V / ±600 mA
• Sink & Measure: ±6 V / ±200 mA / ±2 V / ±600 mA
• 2 channels (1 slot width)
• DC, Pulse (50 µs to 1 s)
• External trigger I/O
• Linear sweep, log sweep, program sweep
Covers Applications from R&D to Production
Frame and SMU Features
• Expandable up to 18 channels with 2-channel SMU
• Digital I/O interface can be selected
• 3-trigger synchronization systems
• Simultaneous measurement of voltage and current possible
• Simplified response adjustment
• High-speed data transfer
• Measurement data storage up to 100 k points per channel
• Channel-to-channel and module-to-module isolation
• Hot swappable modules
The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.
Digital I/O (Factory Option)
Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
Digital I/O Interface Port Configurations
Save polling operations to monitor the timing of voltage or current generation start and end.
Digital I/O Interface Port Configurations | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Various Trigger Synchronization Functions
The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.
Synchronize Frame with External Equipment
Synchronize Channel with External Equipment
Synchronize SMU Channels
Synchronize Frame with External Equipment | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize Channel with External Equipment | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize SMU Channels | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
More Optimized Response Adjustments
The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.
Optimized Response Adjustments | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
High-Quality Pulse Generation and Measurement
• Minimum Pulse Width: 50 μs
• Minimum Cycle: 100 μs
The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.
High-Quality Pulse Generation and Measurement | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Faster Data Transmission Speeds
Reduce the time between measurements for significantly improved operational efficiency.
Faster Data Transmission Speeds | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Fewer Measurement Segments
Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.
Fewer Measurement Divisions | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Specifications
Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.
AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement
AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement
AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement
Source and Measurement Functions
• Voltage or Current
• Generation or Measurement
• Generation and Measurement
Accommodate different function combinations for each channel in each slot:
Source and Measurement Functions | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Source and Measurement Timing
Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.
Source and Measurement Timing | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Sweep
SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.
Sweep | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
典型应用
Static Testing of Laser Diode Module
Generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of the LD.
Features
• Synchronization of LD current sweep with PD current measurement and optical power measurement
• Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
• Measurement data format in CSV or binary format
• Digital I/O interface supports SMU operation start and end response communication
Laser Diode Modules Static Testing | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Filter Characteristic Tests of WDM Photodiode Modules
• Synchronization of wavelength sweep and amplifier IC current measurement
• Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
• Measurement data format in CSV or binary format
Generate different voltages or currents from several wavelength division multiplexing (WDM) channels and use the sweep synchronization function to measure filter characteristics of each individual channel.
WDM Photodiode Modules Filter Characteristic Tests | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
资源下载
详细指标请见 AQ23811A Source Measure Unit (±6 V / ±600 mA) 详细指标页。
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横河测试测量 YOKOGAWA
AQ23811A Source Measure Unit (±6 V / ±600 mA) 详细指标
AQ23811A Source Measure Unit (±6 V / ±600 mA)（源表）关键指标汇总。数据整理自厂商官方产品页与手册资料。
产品简介
The AQ23811A is designed for the evaluation and inspection of optical semiconductor devices such as laser diodes, photodiodes, LEDs, and optical modulators, as well as electronic semiconductor devices such as transistors and FETs. A nine-slot AQ2300 frame can accommodate up to 18 SMU channels.
详细指标
Key Specifications
• Source & Measure: ±6 V / ±600 mA
• Sink & Measure: ±6 V / ±200 mA / ±2 V / ±600 mA
• 2 channels (1 slot width)
• DC, Pulse (50 µs to 1 s)
• External trigger I/O
• Linear sweep, log sweep, program sweep
Covers Applications from R&D to Production
Frame and SMU Features
• Expandable up to 18 channels with 2-channel SMU
• Digital I/O interface can be selected
• 3-trigger synchronization systems
• Simultaneous measurement of voltage and current possible
• Simplified response adjustment
• High-speed data transfer
• Measurement data storage up to 100 k points per channel
• Channel-to-channel and module-to-module isolation
• Hot swappable modules
• The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.
Digital I/O (Factory Option)
• Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
Digital I/O Interface Port Configurations
• Save polling operations to monitor the timing of voltage or current generation start and end.
Various Trigger Synchronization Functions
• The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.
• Synchronize Frame with External Equipment
• Synchronize Channel with External Equipment
• Synchronize SMU Channels
More Optimized Response Adjustments
• The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.
High-Quality Pulse Generation and Measurement
• Minimum Pulse Width: 50 μs
• Minimum Cycle: 100 μs
• The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.
Faster Data Transmission Speeds
• Reduce the time between measurements for significantly improved operational efficiency.
Fewer Measurement Segments
• Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.
Specifications
• Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.
Source and Measurement Functions
• Voltage or Current
• Generation or Measurement
• Generation and Measurement
• Accommodate different function combinations for each channel in each slot:
Source and Measurement Timing
• Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.
Sweep
• SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.
手册与资料
说明
以上指标摘自厂商官方产品页与公开手册，若与随机文件不一致，以随箱文件为准。
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