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E4991B 1MHz至3GHz 分析仪|是德科技 (在产)
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是德科技|KEYSIGHT
ZA5 系列阻抗分析仪，3 GHz
高性能台式阻抗分析仪
产品简介
E4991B 阻抗分析仪在宽阻抗范围内提供 0.65% 基本精度，并提供用于温度特性分析的材料测量选件
核心参数
• 类型：Impedance Analyzer
• 最高频率：3 GHz
• 目标被测件：通用器件、材料
功能特性
• E4991B 阻抗分析仪 1 MHz - 3 GHz
Keysight E4991B 阻抗分析仪是表征和评估电子元件、半导体器件和材料的理想解决方案
三个可升级频率选项：1 MHz 至 500 MHz/1 GHz/3 GHz
基本精度 ±0.65%，阻抗范围 120 mΩ 至 52 kΩ（10% 测量精度范围）
测量参数：|Z|、|Y|、θ、R、X、G、B、L、C、D、Q、|Γ|、Γx、Γy、θΓ、Vac、Iac、Vdc 1、Idc 1（1.
需要选件 001）
内置直流偏置（选件 001）：0 V 至 ±40 V，0 A 至 ±100 mA
10.4 英寸彩色触摸屏 LCD 上支持 4 通道和 4 迹线
数据分析功能：等效电路分析、极限线测试
介电/磁性材料测量（选件 002）：|εr|、εr'、εr''、tanδ(ε)、|μr|、μr'、μr''、tanδ(μ)
温度特性测量（选件 007）和可靠的晶圆上测量（选件 010）能力
材料测量选项提供温度特性分析能力（选件 007）以及介电常数和磁导率的直接读取功能（选件 002）
探针台连接套件（选件 010）提供最高 3 GHz 的精确晶圆上或微型元件阻抗测量解决方案
E4991B 支持多种测试附件，旨在使测量简单可靠
无论您处于研发、QA 还是检验环节，E4991B 都是表征和评估电子元件、半导体器件和材料的理想解决方案
对于材料测量，E4991B 可与 N1500A-005 材料测量套件配合使用，并提供从夹具设置到报告生成的简便测量体验（最高 1 GHz）
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是德科技 | KEYSIGHT
E4991B 1MHz至3GHz 分析仪 详细指标
High-performance benchtop impedance analyzers
一、源规格
– 1 MHz to 3 GHz (Option
300)
– 1 MHz to 1 GHz (Option
100)
– 1 MHz to 500 MHz (Option
050)
Resolution
1 mHz
– without Option E4991B-1E5:
– ± 10 ppm (23 °C
± 5 °C)
–
± 20 ppm (5 °C to 40 °C)
– with Option E4991B-1E5:
–
± 1 ppm (5 °C to 40 °C)
– with Option E4991B-1E5:
–
± 0.5 ppm/year (5 °C to 40 °C) (typical)
– Power (when
50 Ω load is connected to test port):
– –40 dBm to 1 dBm
– 电流 (when 短路 connected 至测试端口)
– 0.0894 mArms to 10 mArms
– 电压 (when 开路 connected 至测试端口)
– 4.47 mVrms to 502 mVrms
Resolution: 0.1 dB
1
Accuracy: (Power, when
50 Ω load is connected to test port)
– Frequency ≤
1 GHz:
– ± 2 dB (23 °C
± 5 °C)
–
± 4 dB (5 °C to 40 °C)
– Frequency >
1 GHz:
– ± 3 dB (23 °C
± 5 °C)
–
± 5 dB (5 °C to 40 °C)
with Option
010:
– Frequency ≤
1 GHz
– Minimum: –3 dB, Maximum: +2 dB (23°C
± 5°C)
– Minimum: –5 dB, Maximum
+4 dB (5 °C to 40 °C)
– Frequency >
1 GHz
– Minimum: –4 dB, Maximum: +3 dB (23°C
± 5°C)
– Minimum: –6 dB, Maximum
+5 dB (5 °C to 40 °C)
输出阻抗
条件：Output impedance: 50 Ω (nominal)
DC Bias (Option E4991B-001)
DC voltage bias
Range: 0 to
± 40 V
Resolution
1 mV
Output impedance (series)
15 Ω (typical)
条件：1. When the unit is set at mV or mA, the entered value is rounded to 0.1 dB resolution.
– ± {0.05% + 5 mV + (|Idc[mA]| x 20 Ω)} (23 °C
± 5 °C)
– ± {0.2% + 10 mV + (|Idc[mA]| x
40 Ω)} (5 °C to 40 °C)
Current limit range
1 mA to 100 mA (both source and sink are limited to same current.)
Current limit resolution
2 µA
Current limit accuracy
± 4% (5 °C to 40 °C, typical)
DC current bias
Range
0 to 100 mA
Resolution
2 µA
Output impedance (shunt)
20 kΩ minimum (typical)
– ± {0.2% + 20 µA + (|Vdc[V]|/10 kΩ)} (23 °C
± 5 °C)
– ± {0.4% +
40 µA + (|Vdc[V]|/5 kΩ)} (5 °C to 40 °C)
Voltage limit range
0.3 V to 40 V (both positive and negative sides are limited to same voltage.)
Voltage limit resolution
1 mV
Voltage limit accuracy: ± (2% + 20 mV + |Idc| x
20 Ω) (5 °C to 40 °C, typical)
电压 monitor 精度
– ± {0.2% + 10 mV + (|Idc[mA]| x
2 Ω)}
(23 °C
± 5 °C, typical)
– ± {0.8% + 24 mV + (|Idc[mA]| x
4 Ω)}
(5 °C to 40 °C, typical)
电流 monitor 精度
– ± {0.2% +
25 µA + (|Vdc[V]|/40 k Ω)}
(23 °C
± 5 °C, typical)
– ± {0.8% +
60 µA + (|Vdc[V]|/20 k Ω)}
(5 °C to 40 °C, typical)
二、扫描规格
扫描条件
Linear frequency, log frequency, OSC level (voltage, current, power), DC bias (voltage, current),
– up 扫描, down 扫描
Number of measurement points
2 to 1601
– 类型: point 延迟, 扫描延迟, segment 延迟
– Range
0 to 30 sec
– Resolution
1 msec
Available setup parameters for each segment
条件：(power, voltage, or current), DC bias (voltage or current), segment time, segment delay.
Sweep frequency range, number of measurement points, point averaging factor, oscillator level
Number of segments
1 to 201
测量精度
条件：Conditions for defining accuracy
Temperature: 23 °C ± 5 °C
1
Accuracy-specified plane
7-mm connector of test head
精度 defined 测量 points
– Same points at which the calibration is done.
2
Basic accuracy (Typical)
0.45%
Accuracy when open/short/load calibration is performed 1. If the calibration is performed in 5 °C to 18 °C or 28 °C to 40 °C, the accuracy is degraded to doubled value (typical). 2. If the calibration is performed in different frequency points or different DC bias points from the measurement
精度 degraded 至 doubled 值 (典型值)
|Z|, |Y|: ±(Ea + Eb) [%] (see Figures 1 through
4 for examples of calculated accuracy)
q: ± (Ea + Eb)
[rad]
100
L, C, X, B: ± (Ea + Eb) x √(1 + D2x) [%]
R, G: ± (Ea + Eb) x √(1 + Q2x) [%]
Ea + Eb
< 1
± 100
especially at Dx ≤
0.1
±
Ea + Eb
< 1
± 100
especially at 10
≥ Qx ≥
10 ± Q2
x
Ea + Eb
Ea + Eb
100
(1 + D2
Ea + Eb
1 Dx tan
Ea + Eb (1 + Q2 x)tan
Ea + Eb
1 Qx tan
测量精度 (Continued)
Accuracy when open/short/load/low-loss capacitor calibration is
Point average factor ≥
32
–23 dBm ≤ oscillator level ≤
+1 dBm
Calibration points are same as measurement points (User frequency mode)
Measurement is performed within
± 1 °C from the calibration temperature
Qx = 测量值 Q
条件：calibration is performed at 23 °C ± 5 °C. When the calibration is performed beyond 23 °C
Ea = (Within ± 5 °C from the calibration temperature. Measurement accuracy applies when the
± 5 °C, measurement error doubles.)
At –23 dBm ≤ oscillator level ≤
1 dBm:
– 0.60 [%] (1 MHz ≤ Frequency ≤
100 MHz)
– 0.70 [%] (100 MHz < Frequency ≤
500 MHz)
– 1.00 [%] (500 MHz < Frequency ≤
1 GHz)
– 2.00 [%] (1 GHz < Frequency ≤
1.8 GHz)
– 4.00 [%] (1.8 GHz < Frequency ≤
3 GHz)
At –33 dBm ≤ oscillator level <
–23 dBm:
– 0.65 [%] (1 MHz ≤ Frequency ≤
100 MHz)
– 0.75 [%] (100 MHz < Frequency ≤
500 MHz)
– 1.05 [%] (500 MHz < Frequency ≤
1 GHz)
– 2.05 [%] (1 GHz < Frequency ≤
1.8 GHz)
– 4.05 [%] (1.8 GHz < Frequency ≤
3 GHz)
[rad]
100
L, C, X, B: ± √(Ea + Eb)2 + (Ec Dx)2 [%]
R, G: ± √(Ea + Eb)2 + (EcQx)2 [%]
< 1
± 100
especially at Dx ≤
0.1
±
< 1
± 100
especially at 10
≥ Qx ≥
10
±Q2
x
Ec
100
(1 + Q2
Ec
1 Qx tan
Ec (1 + D2 x)tan
Ec
1 Dx tan
+Yo• Zx ×
100 [%] Zx
0.03 +
0.08 × F
+ 0.03 [%] at |Zx| < 1 Ω
1000 |Zx|
0.05 +
0.08 × F
+ 0.03 [%] at |Zx| < 3 Ω
1000 |Zx|
0.03 +
0.08 × F
+ 0.03 [%] at |Zx| < 1 Ω
1000 |Zx|
0.03 +
0.08 × F
+
[%] at |Zx | > 1.8 kΩ 1000
60000
0.05 +
0.08 × F
+
[%] at |Zx | > 600 Ω 1000
60000
0.03 +
0.08 × F
+
[%] at |Zx | > 1.8 kΩ 1000
60000
0.06 +
0.08 × F
[%] at 1 Ω ≤ |Zx| ≤ 1.8 kΩ
1000
0.06 +
0.08 × F
[%] at 3 Ω ≤ |Zx| ≤ 600 Ω
1000
0.06 +
0.08 × F
[%] at 1 Ω ≤ |Zx| ≤ 1.8 kΩ
1000
测量精度 (Continued)
At –40 dBm ≤ oscillator level <
–33 dBm:
– 0.80 [%] (1 MHz ≤ Frequency ≤
100 MHz)
– 0.90 [%] (100 MHz < Frequency ≤
500 MHz)
– 1.20 [%] (500 MHz < Frequency ≤
1 GHz)
– 2.20 [%] (1 GHz < Frequency ≤
1.8 GHz)
– 4.20 [%] (1.8 GHz < Frequency ≤
3 GHz)
Ec = (see below) [%]
At 1 MHz ≤ frequency ≤
10 MHz
At 10 MHz < frequency <
100 MHz
At 100 MHz ≤ frequency ≤
3 GHz
(F: 频率 [MHz], 典型值)
Zs = (Specification values of “point averaging factor ≥
8” is applied only when point averaging
factors at both calibration and measurement are
8 or greater.)
At oscillator level =
–3 dBm or –13 dBm:
– (11 + 0.5 × F) [mΩ] (averaging factor ≥
8)
– (12 + 0.5 × F) [mΩ] (averaging factor ≤
7)
At oscillator level =
–23 dBm:
– (12 + 0.5 × F) [mΩ] (averaging factor ≥
8)
– (16 + 0.5 × F) [mΩ] (averaging factor ≤
7)
测量精度 (Continued)
At –23 dBm < oscillator level ≤
1 dBm:
– (17 + 0.5 × F) [mΩ] (averaging factor ≥
8)
– (21 + 0.5 × F) [mΩ] (averaging factor ≤
7)
At –33 dBm ≤ oscillator level <
–23 dBm:
– (25 + 0.5 × F) [mΩ] (averaging factor ≥
8)
– (50 + 0.5 × F) [mΩ] (averaging factor ≤
7)
At –40 dBm ≤ oscillator level <
–33 dBm:
– (50 + 0.5 × F) [mΩ] (averaging factor ≥
8)
– (100 + 0.5 × F) [mΩ] (averaging factor ≤
7)
Yo = (Specification values of “point averaging factor ≥
8” is applied only when point averaging
factors at both calibration and measurement are
8 or greater.)
At –17 dBm ≤ oscillator level ≤
1 dBm:
– (1.7 + 0.1 × F) [μS] (averaging factor ≥
8)
– (4.0 + 0.1 × F) [μS] (averaging factor ≤
7)
At –23 dBm ≤ oscillator level <
–17 dBm:
– (4.0 + 0.1 × F) [μS] (averaging factor ≥
8)
– (8.0 + 0.1 × F) [μS] (averaging factor ≤
7)
At –33 dBm ≤ oscillator level <
–23 dBm:
– (10.0 + 0.1 × F) [μS] (averaging factor ≥
8)
– (30.0 + 0.1 × F) [μS] (averaging factor ≤
7)
At –40 dBm ≤ oscillator level <
–33 dBm:
– (20.0 + 0.1 × F) [μS] (averaging factor ≥
8)
– (60.0 + 0.1 × F) [μS] (averaging factor ≤
7)
Calculated 阻抗测量精度
Figure
1. |Z|, |Y| Measurement accuracy when open/short/load calibration
is performed. Oscillator level = –13 dBm
–3 dBm. Point averaging factor
≥ 8 within
± 5 °C from the calibration temperature.
Figure
2. |Z|, |Y| Measurement accuracy when open/short/load
calibration is performed. Oscillator level –13 dBm
–3 dBm. Point
averaging factor ≤ 7 within
± 5 °C from the calibration temperature.
Calculated 阻抗测量精度 (Continued)
Figure
5. Q accuracy without low-loss capacitor calibration
(Specification) and with low-loss capacitor calibration (Typical).
开路/短路/load 校准
条件：kind of calibration data. The reference plane is called the calibration reference plane.
– Connect open, short, and load standards to the desired reference plane and measure each
Low-loss capacitor calibration
– Connect the dedicated standard (low-loss capacitor) to the calibration reference plane and
Port extension compensation (fixture selection)
条件：plane, set the electrical length between the calibration plane and the device contact.
– When a device is connected to a terminal that is extended from the calibration reference
Select the model number of the registered test fixtures in the E4991B’s setup toolbar or
enter the electrical length for the user’s test fixture
Figure
3. |Z|, |Y| Measurement accuracy when open/short/load calibration
is performed. Oscillator level = –33 dBm. Point averaging factor ≥
8 within
± 5 °C from the calibration temperature.
Figure
4. |Z|, |Y| Measurement accuracy when open/short/load
calibration is performed. Oscillator level =
–33 dBm. Point averaging
factor ≤ 7 within
± 5 °C from the calibration temperature.
开路/短路 compensation
– When a device is connected to a terminal that is extended from the calibration reference
plane, make open and/or short states at the device contact and measure each kind of
Fixed 频率模式
– Obtain calibration/compensation data at fixed frequency covering the entire frequency
range of the E4991B. In device measurement, calibration or compensation is applied
to each measurement point by using interpolation. Even if the measurement points
are changed by altering the sweep setups, you don’t need to retake the calibration/
User-defined 频率模式
条件：data become invalid and retaking calibration/compensation data is recommended.
– Obtain calibration/compensation data at the same frequency as used in actual device
measurement, which are determined by the sweep setups. Each set of calibration/
compensation data is applied to each measurement at the same frequency point. If the
measurement points are changed by altering the sweep setups, calibration/compensation
触发模式
– Internal, external (external trigger input connector), bus (GPIB/LAN/USB), manual (front
设置范围
– Sweep-to-sweep averaging
1 to 999 (integer)
– Point averaging
1 to 999 (integer)
LCD display
– Type/size
10.4 inch TFT color LCD
– Resolution: XGA (1024 x 768)
1
编号迹线
– Data trace
4 data traces per channel (maximum)
– Memory trace
4 memory traces per channel (maximum)
Trace data math
– Data + Memory, Data - Memory, Data x Memory, Data/ Memory, Offset, Equation Editor
– For scalar parameters: linear Y-axis, log Y-axis
条件：1. Valid pixels are 99.99% and more. Below 0.01% of fixed points of black, green, or red are not regarded as
– For complex parameters: Z, Y, εr, µr: polar, complex; Γ: polar, complex, Smith, admittance
Other 显示功能
– Each measurement channel has a display window with independent stimulus. Up to 4
编号标记
– 10 independent markers per trace. Reference marker available for delta marker operation
Marker search
– Search type: max value, min value, multi-peak, multi-target, peak, peak left, peak right,
target, target left, target right, and width parameters with userdefined bandwidth values
Other functions
– Marker continuous mode, Δ marker mode, Marker coupled mode, Marker value substitution
(Marker&), Marker zooming, Marker list, Marker statistics, and Marker signal/dc bias
Circuit models
– 3-component model (4 models)
– 4-component model (3 models)
Analysis types
– Equivalent circuit parameters calculation, frequency characteristics simulation
Limit line test
Define the test limit lines that appear on the display for define the test limit lines that appear
on the display for pass/fail testing. Defined limits may be any combination of horizontal/sloping
lines and discrete data points. testing. Defined limits may be any combination of horizontal/
GPIB
24-pin D-Sub (Type D-24), female; compatible with IEEE-488.
IEEE-488 interface specification is designed to be used in environment where electrical noise is
relatively low. LAN or USBTMC interface is recommended to use at the higher electrical noise
USB host port
Universal serial bus jack, Type A configuration; female; provides connection to mouse,
USB (USBTMC ) 接口端口
Universal serial bus jack, Type B configuration (4 contacts inline); female; provides connection
to an external PC; compatible with USBTMC-USB488 and USB
2.0.LA USB Test and
Measurement Class (TMC) interface that communicates over USB, complying with the IEEE
488.1 and IEEE
488.2 standards.
Handler interface
36-pin centronics, female
测量 Terminal (· 测试 Head)
Connector type
7-mm connector
外部 reference 信号输入连接器
条件：Input impedance: 50 Ω (nominal)
Frequency: 10 MHz
± 10 ppm (typical)
Level: 0 dBm
± 3 dB (typical)
内部 reference 信号输出连接器
条件：Output impedance: 50 Ω (nominal)
Frequency: 10 MHz
± 10 ppm (typical)
Level: 0 dBm ± 3 dB into
50 Ω (typical)
连接器类型: BNC, female
条件：Output impedance: 50 Ω (nominal)
High stability frequency reference output connector (Option E4991B-1E5)
Frequency: 10 MHz
± 1 ppm
Level
0 dBm minimum
– LOW threshold voltage
0.5 V
– HIGH threshold voltage
2.1 V
– Input level range
0 V to +5 V
三、通用规格
Operating condition
Temperature
5 °C to 40 °C
条件：Non-operating storage condition
– 20% to 80% at wet bulb temperature <
+29 °C (non-condensation))
Altitude
0 m to 2,000 m (0 feet to 6,561 feet)
Vibration: 0.21 Grms maximum
5 Hz to 500 Hz
Warm-up time
30 minutes
Temperature
–10 °C to +60 °C
条件：Figure 6. Definition of pulse width (Tp).
– 20% to 90% at wet bulb temperature <
+40 °C (non-condensation)
Altitude
0 m to 4,572 m (0 feet to 15,000 feet)
Vibration: 2.1 Grms maximum
5 Hz to 500 Hz
Postive 触发信号
Tp Tp
5V
OV
5V
四、说明通用规格
条件：frequency is identical to the transmitted interference signal test frequency.
frequency is identical to the transmitted interference signal test frequency.
European Council Directive
2004/108/EC
IEC
61326-1:2012
EN
61326-1:2013
CISPR
11:2009 +A1:2010
EN 55011
2009 +A1:2010
– Group
1, Class A
IEC
61000-4-2:2008
EN
61000-4-2:2009
– 4 kV CD / 8 kV AD
IEC
61000-4-3:2006 +A1:2007 +A2:2010
EN
61000-4-3:2006 +A1:2008 +A2:2010
– 3 V/m, 80-1000 MHz, 1.4 to 2.0 GHz / 1V/m, 2.0 to 2.7 GHz
80% AM
IEC
61000-4-4:2004 +A1:2010
EN
61000-4-4:2004 +A1:2010
– 1 kV power lines / 0.5 kV signal lines
IEC
61000-4-5:2005
EN
61000-4-5:2006
– 0.5 kV line-line / 1 kV line-ground
IEC
61000-4-6:2008
EN
61000-4-6:2009
– 3 V, 0.15-80 MHz
80% AM
IEC
61000-4-8:2009
EN
61000-4-8:2010
– 30A/m
50/60Hz
IEC
61000-4-11:2004
EN
61000-4-11:2004
– 0.5-300 cycle
0% / 70%
NOTE-1: When tested at 3 V/m according to EN61000-4-3, the measurement accuracy will
be within specifications over the full immunity test frequency range except when the analyzer
NOTE-2: When tested at 3 V according to EN61000-4-6, the measurement accuracy will be
within specifications over the full immunity test frequency range except when the analyzer
ICES-001:2006 Group
1, Class A
AS/NZS CISPR11:2004
Group
1, Class A
适用型号 KN11, KN61000-6-1 和 KN61000-6-2
Group
1, Class A
European Council Directive
2006/95/EC
IEC 61010-1:2010 / EN
61010-1:2010
– Measurement Category I
– Pollution Degree
2
EMC, safety, environment and compliance (Continued)
CAN/CSA C22.2 No.
61010-1-12
– Measurement Category I
– Pollution Degree
2
This product complies with the WEEE Directive (2002/96/EC) marking requirements. The
affixed label indicates that you must not discard this electrical/electronic product in domestic
household waste
To return unwanted products, contact your local Keysight ofice .
Product Category: With reference to the equipment types in the WEEE Directive Annex I, this
product is classed as a “Monitoring and Control instrumentation” product. Do not dispose in
Class C
Power requirements 90 V to 264 V AC (Vpeak > 120 V), 47 Hz to 63 Hz
300 VA maximum
Main unit
13 kg
Test head
1 kg
Main unit: See Figure 7 through Figure
9
Test head: See Figure
10
Option 007 test head dimensions: See Figure
11
Option 010 test head dimensions: See Figure
12
Figure
7. Main unit dimensions (front view, in millimeters).
T est Head Interface
RF Out Port 1 Port
2
Marker/Analysis Instrument State
Entry
±42 V Peak Max
Enter 7 8
9 G/n
M/µ654
1 2
3 k/m
x 1+/-.0Meas Format
Impedance Analyzer E4991B
1 MHz-3 GHz
374159
通用特性 (Continued)
Figure
8. Main unit dimensions (rear view, in millimeters).
GPIB
24 BIT I/O EXT TRIG
REF OUT
REF IN 10 MHz (OPT
1E5)
WNANAL YZERF36
C US
ICES/NMB-001
ISM GRP
1-A
100 - 240 VLINE
50/60 Hz
300 VA Max
RSVD 145 1923391927 22130 9
12
13
13
24223
32
18
215
13
222
Figure
9. Main unit dimensions (side view, in millimeters).
DUT Port
Only for E4991B
E4991B T est Head
RF Out Port 1 Port
2
±42 V Peak Max
Output 160 42 59 41
20
Figure
10. Test head dimensions (in millimeters).
Figure
11. Option E4991B-007 test head dimensions (in millimeters).
适用型号 E4991BE4991B
Temperature Characteristic Test KitTemperature Characteristic Test Kit
Opt 007Opt
007
Avoid Static DischargeAvoid Static Discharge ±42V
±42V
通用特性 (Continued)
Figure
12. Option E4991B-010 test head dimensions (in millimeters).
DUT Port
Only for E4991B
Out Port 1 Port
2
E4991B-010 T est Head
±42 V Peak Max
Output 33 63 40
6
Option E4991B-002 Material Measurement (Typical)
Permeability parameters: |µ r|, µr’, µr”, tanδ
Using with Keysight 16453A
1 MHz to 1 GHz (typical)
Using with Keysight 16454A
1 MHz to 1 GHz (typical)
– Open, short, and load calibration at electrodes of 16453A when using the
16453A
– Open, short, and load calibration at test port (7-mm connector) of the test head, then Short
compensation at 16454A when using the
16454A
校准温度
条件：– Calibration is performed at an environmental temperature within the range of 23 °C ± 5 °C.
– Measurement accuracy doubles when calibration temperature is
5 °C to 18 °C or 28 °C to
40 °C.
条件：is performed at 23 °C ± 5 °C. When the calibration is below 18 °C or above 28 °C,
– Temperature deviation: within
± 5 °C from the calibration temperature
– Environment temperature: Measurement accuracy applies when the calibration
测量频率 points
条件：Ea = at Frequency ≤ 1 GHz: 1. In fixed frequency calibration mode, if a measurement frequency point is not included in the calibration points, the accuracy at the measurement point is degraded to its doubled value (typical).
– Same as calibration points
1
– Point averaging factor: ≥
8
– Electrode pressure setting of 16453A: maximum
Typical accuracy of permittivity parameters: εr’ accuracy (at tanδ <
0.1)
Loss tangent accuracy of ε ‘r (= ∆tanδ): ± (Ea + Eb) (at tanδ <
0.1) where
=
∆[' r m
:
[' r m ± 5 + 10 +
0.1 t
+ 0.25
['r m
+
[%] f ['r m t 1– 13
2 f √['r m
0.002 + 0.001
• t + 0.1
0.004f +
f ['r m
• 1– 13
2 f √['r m
Option E4991B-002 Material Measurement (Typical) (Continued)
Eb = f = Measurement frequency [GHz] t = Thickness of MUT (material under test) [mm]
[‘r m = Measured value of [‘r tand = Measured value of dielectric loss tangent
Typical accuracy of permeability parameters: µr’ accuracy (at tand <
0.1)
Loss tangent accuracy of µ r (= ∆tand): ±( Ea + Eb ) (at tand <
0.1) where
Eb = f = 测量频率 [GHz]
F = h = Height of MUT (material under test) [mm] b = Inner diameter of MUT (material under test) [mm] c = Outer diameter of MUT (material under test) [mm]
µ’r m = Measured value of µ’r tand = Measured value of loss tangent
∆['r m
• 1 + ['r m
0.002 tand
['rm
100 t
=
∆µ' r m
µ' r m 4 + 0.02 25 + Fµ'r m 1 + 15 2 f
2 [%] f Fm´r m Fµ'r m
×
• 0.002 + 0.001 +
0.004 f
Fµ'r mf
条件：Figure 13. Permittivity accuracy (∆[‘r) vs. frequency (at t = 0.3 mm, typical).
∆µr m' • tand µ'r m
100 h ln c [mm] b
Option E4991B-002 Material Measurement (Typical) (Continued)
条件：1. This graph shows only frequency dependence of Ea to simplify it. The typical accuracy of tan d is defined as Ea + Eb; refer to “Typical accuracy of permittivity
Option E4991B-002 Material Measurement (Typical) (Continued)
Figure
16. Dielectric loss tangent (tan d) accuracy vs. frequency
(at t = 0.3 mm, typical)
1
Figure
17. Dielectric loss tangent (tan d) accuracy vs. frequency
(at t = 1 mm, typical)
1
Figure
18. Dielectric loss tangent (tan d) accuracy vs. frequency
(at t = 3 mm, typical)
1
parameters” on page
15.
Figure 19. Permittivity ([' r) vs. frequency (at t =
0.3 mm, typical)
Figure 20. Permittivity ([’ r) vs. frequency (at t =
1 mm, typical)
Figure 21. Permittivity ([’ r) vs. frequency (at t =
3 mm, typical)
Figure 22. Permeability accuracy (∆µ'r) vs. frequency (at F =
0.5 mm, typical)
Figure 24. Permeability accuracy (∆µ'r) vs. frequency (at F =
10 mm, typical)
Option E4991B-002 Material Measurement (Typical) (Continued)
Examples of calculated permeability measurement accuracy
Figure 23. Permeability accuracy (∆µ'r) vs. frequency (at F =
3 mm, typical)
条件：1. This graph shows only frequency dependence of Ea to simplify it. The typical accuracy of tan δ is defined as Ea + Eb; refer to “Typical accuracy of permeability
Figure
25. Permeability loss tangent (tan d) accuracy vs. frequency
(at F = 0.5 mm, typical)
1
Figure
26. Permeability loss tangent (tan d) accuracy vs. frequency
(at F = 3 mm, typical)
1
Figure
27. Permeability loss tangent (tan d) accuracy vs. frequency
(at F = 10 mm, typical)
1
Figure 28. Permeability (µ' r) vs. frequency (at F =
0.5 mm, typical)
Figure 29. Permeability (µ' r) vs. frequency (at F =
3 mm, typical)
Figure 30. Permeability (µ' r) vs. frequency (at F =
10 mm, typical)
parameters” on page
16.
Option E4991B-002 Material Measurement (Typical) (Continued)
Option E4991B-007 Temperature Characteristic Test Kit
This section contains specifications and supplemental information for the E4991B Option
E4991B-007. Except for the contents in this section, the E4991B standard specifications
– –55 °C to +150 °C (at the test port of the high temperature cable)
– +5 °C to +40 °C (Main unit, test head, and their connection cable)
五、源规格
– 1 MHz to 3 GHz (Option
300)
– 1 MHz to 1 GHz (Option
100)
– 1 MHz to 500 MHz (Option
050)
Oscillator level
条件：Measurement accuracy (at 23 °C ± 5 °C)
– The measurement accuracy is specified when the following conditions are met:
Source power accuracy at the test port of the high temperature cable:
– Frequency ≤
1 GHz:
– Minimum: –4 dB, Maximum: +2 dB (23°C
± 5°C)
– Minimum: –6 dB, Maximum
+4 dB (5 °C to 40 °C)
– Frequency >
1 GHz:
– Minimum: –5 dB, Maximum: +3 dB (23°C
± 5°C)
– Minimum: –7 dB, Maximum
+5 dB (5 °C to 40 °C)
Conditions
1
– Calibration: open, short and load calibration is completed at the test port (7-mm
连接器) 高温度 cable
– Calibration temperature: calibration is performed at an environmental temperature
within the range of 23 °C
± 5 °C. Measurement accuracy doubles when calibration
temperature is
+5 °C to +18 °C or +28 °C to +40 °C.
– Measurement temperature range: Within
± 5 °C of calibration temperature
阻抗, admittance 和相位 angle 精度
条件：1. The high temperature cable must be kept at the same position throughout calibration and
|Z|, |Y| ± (Ea + Eb) [%] (see Figure 31 through Figure
34 for calculated accuracy) q ± (Ea + Eb)
[rad]
100
measurement. where,
Ea = At –23 dBm ≤ oscillator level ≤
1 dBm:
0.70 [%] (1 MHz ≤ ƒ≤
100 MHz)
0.80 [%] (100 MHz < IJ
500 MHz)
1.10 [%] (500 MHz < IJ
1 GHz)
2.10 [%] (1 GHz < IJ
1.8 GHz)
4.10 [%] (1.8 GHz < IJ
3 GHz)
At –33 dBm ≤ oscillator level <
–23 dBm:
0.75 [%] (1 MHz ≤ ƒ≤
100 MHz)
0.85 [%] (100 MHz < IJ
500 MHz)
1.15 [%] (500 MHz < IJ
1 GHz)
2.15 [%] (1 GHz < IJ
1.8 GHz)
4.15 [%] (1.8 GHz < IJ
3 GHz)
At –40 dBm ≤ oscillator level <
–33 dBm:
0.90 [%] (1 MHz ≤ ƒ≤
100 MHz)
1.00 [%] (100 MHz < IJ
500 MHz)
1.30 [%] (500 MHz < IJ
1 GHz)
2.30 [%] (1 GHz < IJ
1.8 GHz)
4.30 [%] (1.8 GHz < IJ
3 GHz)
(Where, ƒ is frequency)
Eb = Zs + Yo × |Zx| ×
100 [%]
|Zx| = 测量值 |Z|
Zs = At oscillator level =
–3 dBm, or –13 dBm:
(23 + 0.5 × F) [mΩ] (point averaging factor ≥
8)
(24 + 0.5 × F) [mΩ] (point averaging factor ≤
7)
At oscillator level =
–23 dBm:
(24 + 0.5 × F) [mΩ] (point averaging factor ≥
8)
(28 + 0.5 × F) [mΩ] (point averaging factor ≤
7)
At –23 dBm < oscillator level ≤
1 dBm:
(29 + 0.5 × F) [mΩ] (point averaging factor ≥
8)
(36 + 0.5 × F) [mΩ] (point averaging factor ≤
7)
At –33 dBm ≤ oscillator level <
–23 dBm:
(35 + 0.5 × F) [mΩ] (point averaging factor ≥
8)
(70 + 0.5 × F) [mΩ] (point averaging factor ≤
7)
At –40 dBm ≤ oscillator level <
–33dBm:
(50 + 0.5 × F) [mΩ] (point averaging factor ≥
8)
(150 + 0.5 × F) [mΩ] (point averaging factor ≤
7)
(Where, F is frequency in MHz)
Yo = At –17 dBm ≤ oscillator level ≤
1 dBm:
(8 + 0.1 × F) [μS] (averaging factor ≥
8)
(10 + 0.1 × F) [μS] (averaging factor ≤
7)
Option E4991B-007 Temperature Characteristic Test Kit (Continued)
Option E4991B-007 Temperature Characteristic Test Kit (Continued)
At –23 dBm ≤ oscillator level <
–17 dBm:
(10 + 0.1 × F) [μS] (averaging factor ≥
8)
(14 + 0.1 × F) [μS] (averaging factor ≤
7)
At –33 dBm ≤ oscillator level <
–23 dBm:
(15 + 0.1 × F) [μS] (averaging factor ≥
8)
(40 + 0.1 × F) [μS] (averaging factor ≤
7)
At –40 dBm ≤ oscillator level <
–33 dBm:
(35 + 0.1 × F) [μS] (averaging factor ≥
8)
(80 + 0.1 × F) [μS] (averaging factor ≤
7)
Calculated 阻抗/Admittance 测量精度
Figure
34. |Z|, |Y| measurement accuracy when open/short/load
calibration is performed. Oscillator level =
–33 dBm. Point averaging
factor ≤ 7 within
± 5 °C of calibration temperature.
Figure
32. |Z|, |Y| measurement accuracy when open/short/load
calibration is performed. Oscillator level –13 dBm
–3 dBm. Point
averaging factor ≤ 7 within
± 5 °C of calibration temperature.
Figure
31. |Z|, |Y| measurement accuracy when open/short/load
calibration is performed. Oscillator level = –13 dBm
–3 dBm. Point
averaging factor ≥ 8 within
± 5 °C of calibration temperature.
Figure
33. |Z|, |Y| measurement accuracy when open/short/load
calibration is performed. Oscillator level =
–33 dBm. Point averaging
factor ≥ 8 within
± 5 °C of calibration temperature.
When the temperature at the test port (7-mm connector) of the high temperature cable
changes from the calibration temperature, typical measurement accuracy involving
temperature dependence effects (errors) is applied. The typical measurement accuracy
is represented by the sum of error due to temperature coefficients ( E´a, Y´o and Z´s),
hysteresis error ( Eah , Yoh and Zsh) and the specified accuracy.
Temperature compensation
– Temperature compensation data is acquired at the same temperature points as
measurement temperatures
条件：Typical measurement accuracy (involving temperature dependence effects):
|Z|, |Y|: ± ( Ea + Eb + Ec + Ed) [%] q : ± (Ea + Eb + Ec + Ed)
[rad]
100
Where, Ea, Eb = Refer pages
25 and 26.
Ec = E´a × ∆T + Eah [%]
Ed = Z´s× ∆T + Zsh + (Y´ o× ∆T + Yoh) × |Zx| ×
100 [%]
Here, E´a, Z´s and Y´o are given by the following equations
Without temperature compensation With temperature compensation
1 MHz ≤ ƒ < 500 MHz 500 MHz ≤ ƒ ≤
3 GHz
Ea´ 0.006 + 0.015 × ƒ [%/°C] 0.006 + 0.015 × ƒ [%/°C] 0.006 +
0.015 × ƒ [%/°C]
Zs´ 1 + 10 × ƒ [mΩ/°C] 1 + 10 × ƒ [mΩ/°C] 5 +
2 × ƒ [mΩ/°C]
Yo´ 0.3 + 3 × ƒ [µS/°C] 0.3 + 3 × ƒ [µS/°C] 1.5 +
0.6 × ƒ [µS/°C]
Figure
35. Typical frequency characteristics of temperature coefficient
(Ec+Ed)/∆T, when |Zx|=
10 Ω and 250 Ω.
Typical Effects of Temperature Change on Measurement Accuracy
Eah, Zsh and Yoh are given by following equations
条件：∆T = Difference of measurement temperature-from calibration temperature.
when the E4991B with Option 002 and
Eah = Ea´ × ∆Tmax ×
0.3 [%]
Zsh = Zs´ × ∆Tmax ×
0.3 [mΩ]
Yoh = Yo´ × ∆Tmax ×
0.3 [µS]
Use ∆T = 0 °C if temperature compensation is set to off and the difference
≤ 5 °C.
Use ∆T = 0 °C if temperature compensation is set to on and the difference
≤ 20 °C.
∆Tmax = Maximum temperature change (°C) at the test port from calibration
temperature after the calibration is performed. Use ∆Tmax =
0 °C if
maximum temperature change ≤
10 °C.
Typical Effects of Temperature Change on Measurement Accuracy (Continued)
Typical Material Measurement Accuracy When Using Options
002 and 007
Material measurement accuracy contains the permittivity and permeability measurement accuracy
以上指标摘自厂家官方数据手册，完整定义、测试条件与保证值口径以手册为准。完整指标、测试条件与定义口径请见产品页「软件和手册 | 白皮书」栏目中的官方数据手册。
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• 苏州锦凡精密仪器科技有限公司（苏州）
苏州市高新区滨河路625号创业大厦5幢505
邮编：215011
电话：18914031336
邮箱：18914031336@jfsz.net
解决方案合作伙伴
• Tokyo Weld Co., Ltd.（Ota-ku）
2-28-1 Kitamagome
邮编：143-0021
电话：81-3-3775-4331
传真：81-3-3775-4359
邮箱：d-imai@tokyoweld.com
• 上海恒榉电子科技有限公司（Shanghai）
上海市奉贤区南桥镇西闸公路1036号3栋2层
邮编：201401
电话：18112779808
邮箱：salesvalue@everise-hj.com
• 佳燁科技股份有限公司(Ghiatek)（桃園市龜山區）
光明街243巷2號
邮编：33372
电话：+886-3-350-9960
传真：+886-3-320-3475
邮箱：support@ghiatek.com
• 华美博科技（北京）有限公司（北京市）
蓝靛厂东路2号金源时代商务中心C座9A2海淀区
邮编：100097
电话：010-88598732
邮箱：sino@sino-microtech.com
• 和创联合科技（北京）有限公司（北京市）
中关村东路18号财智国际大厦A座1612海淀区
邮编：100083
电话：400 650 7802
邮箱：info@hisuntest.com
• 昆山捷得立电子有限公司（昆山市）
登云路288号海创大厦C座25楼
邮编：215316
电话：0512-36831748
邮箱：sales@jiedeli-china.com
• 深圳市捷泰普科技有限公司（深圳市）
宝安区西乡街道前进二路桃源居南面深圳市智汇创新中心A座216室
邮编：518126
电话：0755-83908488
邮箱：sales@jtptech.cn
• 深圳市易捷测试技术有限公司（深圳市）
福虹路9号世贸广场C座1203室福田区
邮编：518033
电话：0755-83698930
邮箱：dongni.zhang@gbit.net.cn
官网：gbit.net.cn
• 深圳市泰仕捷科技有限公司（深圳市）
松岗大道7号汉海达大厦616室宝安区
邮编：518105
电话：0755-27128586
邮箱：riky.gua@tesijet.com
• 深圳市蓉声科技有限公司（深圳市）
福中路海连大厦连天阁 1103 室福田区
邮编：518033
电话：13828880571
邮箱：jiang.qian@radiation-test.com
• 苏州伊欧陆系统集成有限公司（苏州）
星湖街218号生物纳米园A7楼305室苏州工业园区
邮编：215000
电话：4008808776
邮箱：info@eoulu.com
• EM Labs Inc.（Kobe）
1-4-13 Mizukasadori, Nagata
邮编：653-0842
电话：+81-50-5370-0262
邮箱：info@emlabs.jp
• MPI Corporation（Chupei）
No. 155 Chungho Street
邮编：302
电话：+886-3-555-1771
传真：+886-3-551-8381
邮箱：info@mpi-corporation.com
官网：www.mpi-corporation.com/ast
• NOFFZ（Tönisvorst）
Vorster Strasse 238
邮编：47918
电话：+49 2151-99878-0
邮箱：info@noffz.com
• Power Technology Solutions（Santa Clara）
3048 Scott Blvd
邮编：95054
电话：650-308-8091 ext:
传真：408-727-0827
邮箱：inquiries@pwrts.com
• Resillion（Hasselt）
Kempische Steenweg 303
邮编：3500
电话：+32 498 92 01 71
邮箱：global-ci-sales@resillion.com
• Suzhou Link Ways Tech Co., Ltd.（Suzhou）
16F, Block B, Jin Shi Wang Hu Building, No. 18, Jia Rui alley, SIP
邮编：215021
电话：+86 512 6602 8998
• 上海凌测电子科技有限公司（上海）
峨山路91弄120号陆家嘴软件园8号楼401A室浦东新区
邮编：200127
电话：021-61090608
邮箱：yue.lin@merlintest.com.cn
• 上海北汇信息科技有限公司（上海市）
秀路100号虹桥总部1号4号楼3C闵行区紫
邮编：201103
电话：021-34716271
邮箱：info@polelink.com
官网：polelink.com
• 上海怿星电子科技有限公司（上海市）
钦州北路1199号智汇园87号楼5F室徐汇区
邮编：200233
电话：021-64955659
邮箱：biz@e-planet.cn
• 东昇电磁兼容技术(深圳)有限公司（深圳市）
福田中心区26-3路中国凤凰大厦2栋25G
邮编：518026
电话：0755-82792411
邮箱：sales@jstoyo.cn
• 南京派格测控科技有限公司（南京市）
建邺区建邺人才服务大厦16楼
邮编：210019
电话：4008920858
邮箱：sales@pgtec.cn
官网：pgtec.cn
• 南京纳特通信电子有限公司（南京市）
江宁开发区临淮街20号
邮编：210012
电话：025-84471796
邮箱：sales@rflight.cn
• 深圳市研辰科技有限公司（深圳市）
益田路3008号皇都广场C座2815室福田区
邮编：518048
电话：0755-82828703
邮箱：roger_huang@ascentest.com
原厂翻新与二手仪器
• 是德科技原厂二手仪器商城（Keysight Certified Pre-Owned）：www.keysight.com/used/cn/zh/
• 原厂翻新仪器经与新品相同的最终测试与校准，原厂保修最长 5 年；享 40%–90% 折扣，另有线上 5% / 教育 15% 优惠
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